Transmission electron microscopic investigations of heteroepitaxial III/V semiconductor thin layer and quantum well structures

Transmission electron microscopic investigations of heteroepitaxial III/V semiconductor thin layer and quantum well structures

The first part of the thesis presents compositional evaluation of ternary quantum well structures grown on GaAs and GaP substrates using the chemical sensitive 002 dark field imaging in Transmission Electron Microscopy (TEM). The composition retrieved by the dark field intensity measurements and the...

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Bibliographic Details
Main Author: Németh Igor
Contributors: Volz, Kerstin (Dr.) (Thesis advisor)
Format: Doctoral Thesis
Language:English
Published: Philipps-Universität Marburg 2008
Subjects:
TEM
Refined structure factor calculations
Physik
Heteroepitaxie
Durchstrahlungselektronenmikroskopie
Verfeinerte Strukturfaktorberechnungen
Planar defects
Strukturfaktor
Gitterbaufehler
Planardefekte
Physics
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