Arama Sonuçları - Volz, Kerstin (Prof. Dr.)

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  1. 1
    Growth Dynamics and Morphology of GaP Nanowires investigated via Transmission Electron Microscopy

    Growth Dynamics and Morphology of GaP Nanowires investigated via Transmission Electron Microscopy Yazar: Krug, David Peter

    Baskı/Yayın Bilgisi 2023
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  2. 2
    In-situ Transmission Electron Microscopy of Crystal Growth under MOVPE Conditions

    In-situ Transmission Electron Microscopy of Crystal Growth under MOVPE Conditions Yazar: Widemann, Maximilian

    Baskı/Yayın Bilgisi 2023
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  3. 3
    Composition Determination of Semiconductors at Different Scattering Angles with the Help of Energy-Filtered STEM and Four-Dimensional STEM

    Composition Determination of Semiconductors at Different Scattering Angles with the Help of Energy-Filtered STEM and Four-Dimensional STEM Yazar: Firoozabadi, Seyyed Salehedin

    Baskı/Yayın Bilgisi 2022
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  4. 4
    Epitaxial Growth of Highly Mismatched Alloys on GaAs Substrates

    Epitaxial Growth of Highly Mismatched Alloys on GaAs Substrates Yazar: Hepp, Thilo

    Baskı/Yayın Bilgisi 2022
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  5. 5
    Investigation of the Surface Reconstruction and Gas Phase Composition during Growth by MOVPE

    Investigation of the Surface Reconstruction and Gas Phase Composition during Growth by MOVPE Yazar: Maßmeyer, Oliver Peter

    Baskı/Yayın Bilgisi 2021
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  6. 6
    Analysis of Strain Relaxation, Ion Beam Damage and Instrument Imperfections for Quantitative STEM Characterizations

    Analysis of Strain Relaxation, Ion Beam Damage and Instrument Imperfections for Quantitative STEM Characterizations Yazar: Belz, Jürgen

    Baskı/Yayın Bilgisi 2019
    Diğer Yazarlar: “…Volz, Kerstin ( Prof. Dr.)…”
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  7. 7
    Methods and challenges in STEM composition determination of III/V semiconductors via complementary multislice simulations

    Methods and challenges in STEM composition determination of III/V semiconductors via complementary multislice simulations Yazar: Duschek, Lennart

    Baskı/Yayın Bilgisi 2019
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  8. 8
    Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations

    Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations Yazar: Kükelhan, Pirmin

    Baskı/Yayın Bilgisi 2019
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  9. 9
    (Ga,In)(N,As,Sb) Solar Cells: N Incorporation using Novel Precursor in MOVPE Growth and Solar Cell Characteristics

    (Ga,In)(N,As,Sb) Solar Cells: N Incorporation using Novel Precursor in MOVPE Growth and Solar Cell Characteristics Yazar: Sterzer, Eduard

    Baskı/Yayın Bilgisi 2018
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  10. 10
    In Situ Thermal Annealing and Growth Investigations on III/V Semiconductor Materials

    In Situ Thermal Annealing and Growth Investigations on III/V Semiconductor Materials Yazar: Straubinger, Rainer

    Baskı/Yayın Bilgisi 2018
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  11. 11
    MOVPE Growth Studies on Dilute Bismide Containing III/Vs & Development of an MOVPE In-Situ Gas Phase Analysis Setup

    MOVPE Growth Studies on Dilute Bismide Containing III/Vs & Development of an MOVPE In-Situ Gas Phase Analysis Setup Yazar: Nattermann, Lukas Klaus

    Baskı/Yayın Bilgisi 2017
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  12. 12
    Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy

    Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy Yazar: Han, Han

    Baskı/Yayın Bilgisi 2017
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  13. 13
    Electron Microscopy Characterization of Pentacene and Perfluoropentacene Grown on Different Substrates

    Electron Microscopy Characterization of Pentacene and Perfluoropentacene Grown on Different Substrates Yazar: Félix Ángel, Rocío

    Baskı/Yayın Bilgisi 2017
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  14. 14
    Structural characterization of antimonide-based metamorphic buffer layers on (001) silicon substrate

    Structural characterization of antimonide-based metamorphic buffer layers on (001) silicon substrate Yazar: Ott, Andrea

    Baskı/Yayın Bilgisi 2017
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  15. 15
    Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy

    Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy Yazar: Knaub, Nikolai

    Baskı/Yayın Bilgisi 2016
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  16. 16
    Microstructural Characterization of Dilute N-Containing Semiconductor Alloys and Heterostructures by Scanning Transmission Electron Microscopy

    Microstructural Characterization of Dilute N-Containing Semiconductor Alloys and Heterostructures by Scanning Transmission Electron Microscopy Yazar: Wegele, Tatjana

    Baskı/Yayın Bilgisi 2016
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  17. 17
    Growth and characterization of dilute bismide GaAs based alloys for high efficiency infra red laser diodes

    Growth and characterization of dilute bismide GaAs based alloys for high efficiency infra red laser diodes Yazar: Ludewig, Peter

    Baskı/Yayın Bilgisi 2014
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  18. 18
    Quantitative Untersuchungen der Zusammensetzung von kubischen III/V-Verbindungshalbleitern mittels HAADF-STEM

    Quantitative Untersuchungen der Zusammensetzung von kubischen III/V-Verbindungshalbleitern mittels HAADF-STEM Yazar: Fritz, Rafael

    Baskı/Yayın Bilgisi 2014
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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  19. 19
    Hochaufgelöste transmissionselektronenmikroskopische Untersuchungen an Galliumphosphid auf Silizium

    Hochaufgelöste transmissionselektronenmikroskopische Untersuchungen an Galliumphosphid auf Silizium Yazar: Beyer, Andreas

    Baskı/Yayın Bilgisi 2012
    Diğer Yazarlar: “…Volz, Kerstin (Prof. Dr.)…”
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