Resultados da pesquisa - Volz, Kerstin (Prof. Dr.)

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  1. 1
    Growth Dynamics and Morphology of GaP Nanowires investigated via Transmission Electron Microscopy

    Growth Dynamics and Morphology of GaP Nanowires investigated via Transmission Electron Microscopy Por Krug, David Peter

    Publicado em 2023
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  2. 2
    In-situ Transmission Electron Microscopy of Crystal Growth under MOVPE Conditions

    In-situ Transmission Electron Microscopy of Crystal Growth under MOVPE Conditions Por Widemann, Maximilian

    Publicado em 2023
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  3. 3
    Composition Determination of Semiconductors at Different Scattering Angles with the Help of Energy-Filtered STEM and Four-Dimensional STEM

    Composition Determination of Semiconductors at Different Scattering Angles with the Help of Energy-Filtered STEM and Four-Dimensional STEM Por Firoozabadi, Seyyed Salehedin

    Publicado em 2022
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  4. 4
    Epitaxial Growth of Highly Mismatched Alloys on GaAs Substrates

    Epitaxial Growth of Highly Mismatched Alloys on GaAs Substrates Por Hepp, Thilo

    Publicado em 2022
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  5. 5
    Investigation of the Surface Reconstruction and Gas Phase Composition during Growth by MOVPE

    Investigation of the Surface Reconstruction and Gas Phase Composition during Growth by MOVPE Por Maßmeyer, Oliver Peter

    Publicado em 2021
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  6. 6
    Analysis of Strain Relaxation, Ion Beam Damage and Instrument Imperfections for Quantitative STEM Characterizations

    Analysis of Strain Relaxation, Ion Beam Damage and Instrument Imperfections for Quantitative STEM Characterizations Por Belz, Jürgen

    Publicado em 2019
    Outros Autores: “...Volz, Kerstin ( Prof. Dr.)...”
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  7. 7
    Methods and challenges in STEM composition determination of III/V semiconductors via complementary multislice simulations

    Methods and challenges in STEM composition determination of III/V semiconductors via complementary multislice simulations Por Duschek, Lennart

    Publicado em 2019
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  8. 8
    Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations

    Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations Por Kükelhan, Pirmin

    Publicado em 2019
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  9. 9
    (Ga,In)(N,As,Sb) Solar Cells: N Incorporation using Novel Precursor in MOVPE Growth and Solar Cell Characteristics

    (Ga,In)(N,As,Sb) Solar Cells: N Incorporation using Novel Precursor in MOVPE Growth and Solar Cell Characteristics Por Sterzer, Eduard

    Publicado em 2018
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  10. 10
    In Situ Thermal Annealing and Growth Investigations on III/V Semiconductor Materials

    In Situ Thermal Annealing and Growth Investigations on III/V Semiconductor Materials Por Straubinger, Rainer

    Publicado em 2018
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  11. 11
    MOVPE Growth Studies on Dilute Bismide Containing III/Vs & Development of an MOVPE In-Situ Gas Phase Analysis Setup

    MOVPE Growth Studies on Dilute Bismide Containing III/Vs & Development of an MOVPE In-Situ Gas Phase Analysis Setup Por Nattermann, Lukas Klaus

    Publicado em 2017
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  12. 12
    Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy

    Quantitative Evaluation of the Interfaces in III/V Semiconductors with Scanning Transmission Electron Microscopy Por Han, Han

    Publicado em 2017
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  13. 13
    Electron Microscopy Characterization of Pentacene and Perfluoropentacene Grown on Different Substrates

    Electron Microscopy Characterization of Pentacene and Perfluoropentacene Grown on Different Substrates Por Félix Ángel, Rocío

    Publicado em 2017
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  14. 14
    Structural characterization of antimonide-based metamorphic buffer layers on (001) silicon substrate

    Structural characterization of antimonide-based metamorphic buffer layers on (001) silicon substrate Por Ott, Andrea

    Publicado em 2017
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  15. 15
    Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy

    Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy Por Knaub, Nikolai

    Publicado em 2016
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  16. 16
    Microstructural Characterization of Dilute N-Containing Semiconductor Alloys and Heterostructures by Scanning Transmission Electron Microscopy

    Microstructural Characterization of Dilute N-Containing Semiconductor Alloys and Heterostructures by Scanning Transmission Electron Microscopy Por Wegele, Tatjana

    Publicado em 2016
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  17. 17
    Growth and characterization of dilute bismide GaAs based alloys for high efficiency infra red laser diodes

    Growth and characterization of dilute bismide GaAs based alloys for high efficiency infra red laser diodes Por Ludewig, Peter

    Publicado em 2014
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  18. 18
    Quantitative Untersuchungen der Zusammensetzung von kubischen III/V-Verbindungshalbleitern mittels HAADF-STEM

    Quantitative Untersuchungen der Zusammensetzung von kubischen III/V-Verbindungshalbleitern mittels HAADF-STEM Por Fritz, Rafael

    Publicado em 2014
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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  19. 19
    Hochaufgelöste transmissionselektronenmikroskopische Untersuchungen an Galliumphosphid auf Silizium

    Hochaufgelöste transmissionselektronenmikroskopische Untersuchungen an Galliumphosphid auf Silizium Por Beyer, Andreas

    Publicado em 2012
    Outros Autores: “...Volz, Kerstin (Prof. Dr.)...”
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