Dokument
Titel: | Investigation of light-induced defects in hydrogenated amorphous silicon by low temperature annealing and pulsed degradation |
Autor: | Heck, Stephan |
Veröffentlicht: | 2002 |
URI: | https://archiv.ub.uni-marburg.de/diss/z2002/0408 |
DOI: | https://doi.org/10.17192/z2002.0408 |
URN: | urn:nbn:de:hebis:04-z2002-04083 |
DDC: | 530 Physik |
Titel (trans.): | Investigation of light-induced defects in hydrogenated amorphous silicon by low temperature annealing and pulsed degradation |
Publikationsdatum: | 2003-08-06 |
Lizenz: | https://rightsstatements.org/vocab/InC-NC/1.0/ |
Schlagwörter: |
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Hydrogenated amorphous silicon |
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